TLV7034QPWRQ1 >
TLV7034QPWRQ1
Texas Instruments
IC COMPARATOR 4 GEN PUR 14TSSOP
17460 Pcs New Original In Stock
Comparator General Purpose Rail-to-Rail 14-TSSOP
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TLV7034QPWRQ1 Texas Instruments
5.0 / 5.0 - (263 Ratings)

TLV7034QPWRQ1

Product Overview

10195830

DiGi Electronics Part Number

TLV7034QPWRQ1-DG

Manufacturer

Texas Instruments
TLV7034QPWRQ1

Description

IC COMPARATOR 4 GEN PUR 14TSSOP

Inventory

17460 Pcs New Original In Stock
Comparator General Purpose Rail-to-Rail 14-TSSOP
Quantity
Minimum 1

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  • 1 0.7776 0.7776
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TLV7034QPWRQ1 Technical Specifications

Category Linear, Comparators

Manufacturer Texas Instruments

Packaging Cut Tape (CT) & Digi-Reel®

Series -

Product Status Active

Type General Purpose

Number of Elements 4

Output Type Rail-to-Rail

Voltage - Supply, Single/Dual (±) 1.6V ~ 6.5V

Voltage - Input Offset (Max) 8mV

Current - Input Bias (Max) -

Current - Output (Typ) -

Current - Quiescent (Max) 315nA

CMRR, PSRR (Typ) 73dB CMRR, 77dB PSRR

Propagation Delay (Max) 3µs

Hysteresis 17mV

Operating Temperature -40°C ~ 125°C

Package / Case 14-TSSOP (0.173", 4.40mm Width)

Mounting Type Surface Mount

Supplier Device Package 14-TSSOP

Datasheet & Documents

HTML Datasheet

TLV7034QPWRQ1-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.39.0001

Additional Information

Other Names
296-TLV7034QPWRQ1TR
296-TLV7034QPWRQ1DKR
296-TLV7034QPWRQ1CT
Standard Package
2,000

Reviews

5.0/5.0-(Show up to 5 Ratings)
HerzSc***ggefühl
Dec 02, 2025
5.0
Das schnelle Shipping war der Hit – ich hatte meine Produkte innerhalb kürzester Zeit.
ほ***けら
Dec 02, 2025
5.0
しっかりとした包装とリーズナブルな価格で、信頼して購入できるお店です。
Shimm***ngSoul
Dec 02, 2025
5.0
The quality exceeds industry standards—simply fantastic.
Radia***reams
Dec 02, 2025
5.0
I appreciate the careful and secure packaging that DiGi Electronics provides.
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Frequently Asked Questions (FAQ)

Can the TLV7034QPWRQ1 be safely used in a 5V automotive power monitoring circuit where input transients may exceed the supply rails, and how should I protect it from overvoltage without degrading comparator response time?

The TLV7034QPWRQ1 has rail-to-rail inputs but is not designed to tolerate voltages beyond its supply range (1.6V to 6.5V). In automotive environments with load dump or inductive spikes, you must clamp input signals using fast Schottky diodes to the supply rails or employ a series resistor (e.g., 1kΩ) with external TVS diodes rated below 6.5V. Avoid large RC filters that increase propagation delay beyond the 3µs spec; instead, use low-capacitance protection to maintain signal fidelity while ensuring inputs never exceed VCC + 0.3V or go below GND – 0.3V per the absolute maximum ratings.

Is the TLV7034QPWRQ1 a suitable drop-in replacement for the LMV331 in a battery-powered sensor interface, and what performance trade-offs should I expect in terms of offset voltage and quiescent current?

While both are general-purpose comparators, the TLV7034QPWRQ1 is not a direct drop-in for the LMV331 due to differences in pinout (14-TSSOP vs. SC70/SOT-23) and electrical behavior. The TLV7034QPWRQ1 offers significantly lower quiescent current (315nA max vs. ~100µA for LMV331), making it far better for battery life, but its input offset voltage (up to 8mV) is higher than typical LMV331 units (~3mV). If your application relies on precision threshold detection (e.g., <5mV accuracy), this offset may require calibration or external trimming. Always verify timing and hysteresis compatibility—TLV7034QPWRQ1 includes 17mV internal hysteresis, which the LMV331 lacks.

How does the internal 17mV hysteresis of the TLV7034QPWRQ1 affect noise immunity in a slow-changing analog signal application like temperature threshold detection, and can it be adjusted or disabled if needed?

The built-in 17mV hysteresis in the TLV7034QPWRQ1 improves noise immunity by preventing chatter near the threshold, which is beneficial for slow signals like thermistor outputs. However, this fixed hysteresis cannot be disabled or reduced internally. If your design requires tighter control or asymmetric thresholds, you must add external positive feedback via a resistor network from output to non-inverting input. Be cautious: adding external hysteresis changes the effective trip points and may interact with the internal 17mV, leading to unexpected behavior. Simulate or prototype to confirm threshold margins meet system requirements.

Can I parallel multiple channels of the TLV7034QPWRQ1 to increase output drive capability or improve reliability in a safety-critical industrial control system?

Paralleling outputs of the TLV7034QPWRQ1 is not recommended. Although it has rail-to-rail push-pull outputs, mismatches in propagation delay and output impedance between channels can cause shoot-through currents or uneven loading, potentially exceeding thermal limits or causing oscillation. For higher drive, use a dedicated buffer or MOSFET driver after a single comparator channel. For redundancy in safety-critical systems, use separate comparators with independent references and voting logic rather than paralleling—this avoids common-cause failures and aligns better with functional safety practices like ISO 13849.

What layout and grounding practices are critical when using the TLV7034QPWRQ1 in a mixed-signal PCB with high-speed digital lines nearby to prevent false triggering due to crosstalk or ground bounce?

To prevent false triggering in mixed-signal layouts, isolate the TLV7034QPWRQ1’s analog ground and power traces from digital return paths. Use a solid ground plane beneath the device but avoid routing high-speed digital signals under the comparator or its input traces. Place a 100nF ceramic decoupling capacitor within 2mm of the VCC pin, and consider a small ferrite bead or 10Ω resistor in series with VCC if digital noise coupling is severe. Keep input traces short and shielded (e.g., surrounded by ground), and avoid running them parallel to clock or switching lines. The 77dB PSRR helps, but poor layout can still couple noise directly into high-impedance nodes—validate with bench testing under worst-case digital activity.

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