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CD74HCT75E
Texas Instruments
IC DUAL 2BIT BISTABLE LTCH 16DIP
4277 Pcs New Original In Stock
D-Type Transparent Latch 2 Channel 2:2 IC Differential 16-PDIP
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CD74HCT75E
Product Overview
1242724
DiGi Electronics Part Number
CD74HCT75E-DGManufacturer
Texas Instruments
CD74HCT75E
Description
IC DUAL 2BIT BISTABLE LTCH 16DIPInventory
4277 Pcs New Original In Stock
D-Type Transparent Latch 2 Channel 2:2 IC Differential 16-PDIP
CAD Models - PCB Symbols & Footprints
Quantity
Minimum 1
Minimum 1
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CD74HCT75E Technical Specifications
Category
Logic, Latches
Packaging
Tube
Series
74HCT
Product Status
Active
Logic Type
D-Type Transparent Latch
Circuit
2:2
Output Type
Differential
Voltage - Supply
4.5V ~ 5.5V
Independent Circuits
2
Delay Time - Propagation
11ns
Current - Output High, Low
4mA, 4mA
Operating Temperature
-55°C ~ 125°C
Mounting Type
Through Hole
Package / Case
16-DIP (0.300", 7.62mm)
Supplier Device Package
16-PDIP
Base Product Number
74HCT75
Datasheet & Documents
HTML Datasheet
CD74HCT75E-DG
Environmental & Export Classification
RoHS Status
ROHS3 Compliant
Moisture Sensitivity Level (MSL)
Not Applicable
REACH Status
REACH Unaffected
ECCN
EAR99
HTSUS
8542.39.0001
Additional Information
Other Names
296-2136-5
74HCT75
-CD74HCT75EE4-NDR
-296-2136-5
-CD74HCT75EE4
CD74HCT75
-296-2136-5-DG
-CD74HCT75E-NDR
2166-CD74HCT75E-296
Standard Package
25
Reviews
5.0/5.0-(Show up to 5 Ratings)
Dec 02, 2025
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Dec 02, 2025
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Dec 02, 2025
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Dec 02, 2025
DiGi Electronics' reliable products have consistently met my expectations.
Dec 02, 2025
They offer exceptional value with consistent, well-designed products that suit my needs.
Dec 02, 2025
Their dedication to packaging safety reflects a customer-first philosophy.
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Frequently Asked Questions (FAQ)
What are the key design-in risks when using the CD74HCT75E in a high-temperature industrial application near 125°C?
When designing the CD74HCT75E into high-temperature environments near its 125°C maximum rating, thermal derating and PCB layout become critical. At elevated temperatures, leakage currents increase and propagation delays can vary, affecting timing margins. Ensure adequate airflow or heatsinking if nearby components generate heat. Also, verify signal integrity with worst-case rise/fall times over temperature. The CD74HCT75E's dual 2-bit transparent latch function can experience skew between output pairs under thermal stress—consider adding margin in clock-to-output timing to prevent metastability in downstream logic. Use hysteresis on enable lines if noise is a concern in harsh environments.
How does the CD74HCT75E compare to obsolete 74LS75 in terms of drop-in replacement and HCT series compatibility?
The CD74HCT75E can serve as a modern drop-in replacement for the obsolete 74LS75 but with careful attention to logic level compatibility. Unlike the 74LS75, which uses TTL input thresholds, the CD74HCT75E uses CMOS inputs with TTL-compatible levels (Vih = 2V min), making it safe to drive from legacy 5V TTL outputs. However, the CD74HCT75E has lower input loading and higher speed—11ns vs. ~35ns propagation—so timing glitches that were previously negligible may now be captured. Also, the CD74HCT75E is pin-compatible and shares the 16-DIP footprint, but always verify latch enable timing and data hold requirements in the new design due to faster switching.
Can the CD74HCT75E be used reliably in a differential signaling path despite its differential output configuration?
The term 'differential output' in the CD74HCT75E refers to complementary outputs per latch (Q and Q̅), not true differential signaling like LVDS. These outputs are intended for driving single-ended logic or providing dual control signals (e.g., to H-bridge gates or multiplexer selects), not for high-speed balanced transmission lines. Attempting to use them in a differential signaling system without external conditioning may lead to EMI and skew issues. For reliable operation, treat each output as a standard CMOS signal, route with matched trace lengths if timing matching is needed, and avoid long traces without termination due to the 4mA drive strength limiting edge rate control.
What are the main concerns when replacing a single-bit latch with the CD74HCT75E in a through-hole legacy design?
When replacing discrete or single-channel latches with the CD74HCT75E in a legacy through-hole design, ensure all four latch sections are properly managed—even if unused. Floating inputs on the CD74HCT75E can cause increased power consumption and noise due to oscillation in high-impedance states. Tie unused D and enable (LE) inputs to VCC or GND via pull-up/down resistors. Also, consider that the CD74HCT75E latches are transparent when LE is high; if your original design used edge-triggered behavior, you must modify the control logic to ensure data is stable during the enable window to prevent ripple-through glitches. Maintain decoupling capacitors (0.1µF ceramic) close to VCC/GND pins to handle transient current demands.
How does the 4mA output drive of the CD74HCT75E impact its ability to interface with LEDs or buffers in a mixed-signal system?
The CD74HCT75E's 4mA output drive capability limits direct LED driving to low-brightness indicators only—use current-limiting resistors of at least 1kΩ for 5V operation to stay within spec. For brighter LEDs or driving multiple inputs, buffer the output with a driver IC (e.g., ULN2003A) to avoid exceeding max sink current and causing output voltage degradation. When interfacing with other logic families (e.g., 74HC00 or microcontroller inputs), the 4mA drive is sufficient for one or two loads, but long PCB traces or capacitive loads >50pF can increase rise time and risk timing violations. In mixed-signal systems, isolate the CD74HCT75E's ground path from analog sections to reduce noise coupling through the shared supply.
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CD74HCT75E CAD Models
Texas Instruments CD74HCT75E PCB symbols & footprints
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