ATTINY45-15MT >
ATTINY45-15MT
Microchip Technology
IC MCU 8BIT 4KB FLASH 20WQFN
20472 Pcs New Original In Stock
AVR AVR® ATtiny, Functional Safety (FuSa) Microcontroller IC 8-Bit 16MHz 4KB (2K x 16) FLASH 20-WQFN (4x4)
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ATTINY45-15MT Microchip Technology
5.0 / 5.0 - (153 Ratings)

ATTINY45-15MT

Product Overview

1243492

DiGi Electronics Part Number

ATTINY45-15MT-DG
ATTINY45-15MT

Description

IC MCU 8BIT 4KB FLASH 20WQFN

Inventory

20472 Pcs New Original In Stock
AVR AVR® ATtiny, Functional Safety (FuSa) Microcontroller IC 8-Bit 16MHz 4KB (2K x 16) FLASH 20-WQFN (4x4)
Quantity
Minimum 1

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In Stock (All prices are in USD)
  • QTY Target Price Total Price
  • 1 1.4779 1.4779
  • 10 1.2497 12.4970
  • 30 1.1077 33.2310
  • 100 0.9613 96.1300
  • 500 0.8953 447.6500
  • 1000 0.8667 866.7000
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ATTINY45-15MT Technical Specifications

Category Embedded, Microcontrollers

Manufacturer Microchip Technology

Packaging -

Series AVR® ATtiny, Functional Safety (FuSa)

Product Status Active

DiGi-Electronics Programmable Not Verified

Core Processor AVR

Core Size 8-Bit

Speed 16MHz

Connectivity USI

Peripherals Brown-out Detect/Reset, POR, PWM, WDT

Number of I/O 6

Program Memory Size 4KB (2K x 16)

Program Memory Type FLASH

EEPROM Size 256 x 8

RAM Size 256 x 8

Voltage - Supply (Vcc/Vdd) 2.7V ~ 5.5V

Data Converters A/D 4x10b

Oscillator Type Internal

Operating Temperature -40°C ~ 85°C (TA)

Grade Automotive

Qualification AEC-Q100

Mounting Type Surface Mount

Supplier Device Package 20-WQFN (4x4)

Package / Case 20-WFQFN Exposed Pad

Base Product Number ATTINY45

Datasheet & Documents

HTML Datasheet

ATTINY45-15MT-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 3 (168 Hours)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.31.0001

Additional Information

Other Names
1611-ATTINY45-15MTTR-DG
ATTINY45-15MT-DG
ATTINY45-15MTTR
1611-ATTINY45-15MTCTINACTIVE
1611-ATTINY45-15MTDKR
1611-ATTINY45-15MTDKRINACTIVE
1611-ATTINY45-15MTTRINACTIVE
ATTINY45-15MTCT
ATTINY45-15MTDKR
ATTINY4515MT
1611-ATTINY45-15MTTR
1611-ATTINY45-15MTDKR-DG
Standard Package
6,000

Reviews

5.0/5.0-(Show up to 5 Ratings)
별***는밤
Dec 02, 2025
5.0
배송 상태를 실시간으로 알 수 있는 시스템 덕분에 여러 번 확인하며 기대할 수 있었습니다.
夢***者
Dec 02, 2025
5.0
他們的物流安排得很細心,包裝完整,貨品完好無損。
Joyo***ibes
Dec 02, 2025
5.0
The competitive pricing makes it easier for me to purchase higher-quality items regularly.
Shi***hoal
Dec 02, 2025
5.0
The product consistency and price clarity make my shopping experience excellent.
Peace***Pines
Dec 02, 2025
5.0
After-sales support from DiGi Electronics is consistently excellent.
Sunse***renade
Dec 02, 2025
5.0
Their attentive after-sales assistance has helped me troubleshoot and improve system performance.
Wil***oom
Dec 02, 2025
5.0
Fast response times on the website made shopping a breeze.
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Frequently Asked Questions (FAQ)

When replacing an existing ATTINY45-15MT in a harsh automotive environment, what are the critical considerations for ensuring long-term reliability beyond basic AEC-Q100 qualification, especially concerning temperature cycling and vibration?

While the ATTINY45-15MT is AEC-Q100 qualified, ensuring long-term automotive reliability involves considering the specific stress profiles of your application. For temperature cycling, ensure your PCB layout provides adequate thermal relief around the ATTINY45-15MT to prevent stress on solder joints. Proper board material selection, like high-Tg FR4, is also crucial. For vibration, consider conformal coating the assembled board to add mechanical stability to the component and its solder connections. It's also advisable to perform HALT/HASS (Highly Accelerated Life Testing/Highly Accelerated Stress Screening) on your design with the ATTINY45-15MT integrated, using cycles that mimic your worst-case environmental stresses, to uncover potential weaknesses before mass production.

In a new design requiring a functional safety (FuSa) microcontroller with limited I/O and a need for flexible serial communication, what are the potential integration risks and mitigation strategies when selecting the ATTINY45-15MT over a more complex FuSa MCU?

The primary risk of selecting the ATTINY45-15MT for a FuSa application with limited I/O is its simpler feature set compared to dedicated high-reliability MCUs. While the ATTINY45-15MT offers basic FuSa features, its lack of advanced safety mechanisms like ECC on Flash or detailed fault detection can necessitate significant software-based safety measures and rigorous testing to achieve the desired ASIL level. Mitigation strategies include thorough fault tree analysis (FTA) and Failure Modes and Effects Analysis (FMEA) at the system level to identify and address potential single-point failures. Utilize its 4x10-bit ADCs judiciously for sensor redundancy or self-checking, and ensure robust watchdog timer (WDT) and brown-out detection (BOD) implementations to handle transient faults. Careful code partitioning and static analysis tools are essential for demonstrating software integrity.

For designs transitioning from a standard commercial ATTINY45 variant to the ATTINY45-15MT for functional safety compliance, what are the key programming and debugging challenges and how can they be overcome?

Transitioning to the ATTINY45-15MT for functional safety may introduce programming and debugging challenges primarily related to the specific FuSa features and the need for enhanced traceability. While the core AVR architecture is familiar, ensuring that FuSa-related configurations (like enhanced BOD or WDT behavior) are correctly implemented requires careful code reviews and validation. Debugging FuSa-critical code often demands more sophisticated tools and techniques. Consider using Atmel Studio (now Microchip Studio) with its advanced debugging capabilities, including breakpoints and memory inspection, and ensure your programmer/debugger (e.g., Atmel-ICE, PICKit 4) supports the specific target interface of the ATTINY45-15MT. Implementing robust self-test routines and logging mechanisms within the firmware can also aid in diagnosing issues in the deployed system.

When considering a direct replacement for an older, non-AEC-Q100 ATTINY45 in a high-volume automotive sensor module, what are the potential performance or peripheral compatibility issues with the ATTINY45-15MT, and how can a smooth design-in be ensured?

While the ATTINY45-15MT is designed as a drop-in replacement for the base ATTINY45, the key difference is its AEC-Q100 qualification and potential minor revisions to internal circuitry to meet these standards. The primary risk is ensuring that any subtle timing changes or peripheral behavior variations, although unlikely to be significant given the same clock speed and core, do not impact the critical timing of your existing sensor module. To ensure a smooth design-in for the ATTINY45-15MT, thoroughly re-verify your existing firmware's timing-critical sections, particularly those interacting with the USI (Universal Serial Interface) for communication. Perform comparative testing of the new module with the ATTINY45-15MT against your benchmark test cases using the original ATTINY45 to catch any unexpected behavior.

Given the 4KB FLASH and 256 Bytes RAM limitations of the ATTINY45-15MT, what are the practical design trade-offs and potential pitfalls when implementing complex algorithms or significant safety monitoring functions within these constraints for an automotive application?

Implementing complex algorithms or extensive safety monitoring on the ATTINY45-15MT requires careful resource management. The primary trade-off is the 'code density' versus 'safety features'. Significant safety monitoring, especially if it involves redundancy or detailed fault analysis, can quickly consume the limited 4KB of FLASH. Similarly, algorithms requiring large data structures or extensive intermediate variables will strain the 256 Bytes of RAM. Potential pitfalls include exceeding code size limits, leading to compilation errors, or running out of RAM at runtime, causing unpredictable behavior or crashes. To mitigate this, optimize your code aggressively using compiler flags and efficient algorithms. Consider offloading complex computations to external components if feasible. For safety functions, prioritize essential checks and use bitwise operations and data compression techniques where possible. Allocate RAM strategically and implement strict memory usage tracking during development and testing.

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